Spin valve magnetoresistance element with improved response to magnetic fields

ABSTRACT

A spin valve magnetoresistance element has an even number of free layer structures for which half has an antiferromagnetic coupling and the other half has a ferromagnetic coupling with respect to associated pinned layers. The different couplings are the result of an even number different spacer layers having respective different thicknesses.

CROSS REFERENCE TO RELATED APPLICATIONS

This application claims the benefit under 35 U.S.C. §119(e) of U.S. Provisional Application No. 62/171,532, filed Jun. 5, 2015, which application is incorporated herein by reference in its entirety.

STATEMENT REGARDING FEDERALLY SPONSORED RESEARCH

Not Applicable.

FIELD

This invention relates generally to spin electronics magnetoresistance elements and, more particularly, to spin valve giant magnetoresistance (GMR) elements and spin valve tunnel magnetoresistance (TMR) elements that have two or more active areas to provide an improved response to magnetic fields.

BACKGROUND

As used herein, the term “magnetic field sensing element” is used to describe a variety of electronic elements that can sense a magnetic field. One such magnetic field sensing element is a magnetoresistance (MR) element. The magnetoresistance element has a resistance that changes in relation to a magnetic field experienced by the magnetoresistance element.

As is known, there are different types of magnetoresistance elements, for example, a semiconductor magnetoresistance element such as Indium Antimonide (InSb), a giant magnetoresistance (GMR) element, an anisotropic magnetoresistance element (AMR), and a tunneling magnetoresistance (TMR) element, also called a magnetic tunnel junction (MTJ) element.

Of these magnetoresistance elements, the GMR and the TMR elements operate with spin electronics (i.e., electron spins) where the resistance is related to the magnetic orientation of different magnetic layers separated by nonmagnetic layers. In spin valve configurations, the resistance is related to an angular direction of a magnetization in a so-called “free-layer” respective to another layer so-called “reference layer.” The free layer and the reference layer are described more fully below.

The magnetoresistance element may be a single element or, alternatively, may include two or more magnetoresistance elements arranged in various configurations, e.g., a half bridge or full (Wheatstone) bridge.

As used herein, the term “magnetic field sensor” is used to describe a circuit that uses a magnetic field sensing element, generally in combination with other circuits. In a typical magnetic field sensor, the magnetic field sensing element and the other circuits can be integrated upon a common substrate.

Magnetic field sensors are used in a variety of applications, including, but not limited to, an angle sensor that senses an angle of a direction of a magnetic field, a current sensor that senses a magnetic field generated by a current carried by a current-carrying conductor, a magnetic switch that senses the proximity of a ferromagnetic object, a rotation detector that senses passing ferromagnetic articles, for example, magnetic domains of a ring magnet or a ferromagnetic target (e.g., gear teeth) where the magnetic field sensor is used in combination with a back-biased or other magnet, and a magnetic field sensor that senses a magnetic field density of a magnetic field.

Various parameters characterize the performance of magnetic field sensors and magnetic field sensing elements. With regard to magnetic field sensing elements, the parameters include sensitivity, which is the change in the output signal of a magnetic field sensing element in response to a magnetic field, and linearity, which is the degree to which the output signal of a magnetic field sensor varies linearly (i.e., in direct proportion) to the magnetic field.

GMR and TMR elements are known to have a relatively high sensitivity, compared, for example, to Hall elements. GMR and TMR elements are also known to have moderately good linearity, but over a restricted range of magnetic fields, more restricted in range than a range over which a Hall element can operate. However, it is known that even in the restricted range of magnetic fields, the linearity of the GMR or TMR element suffers from irregularities. Also, it is known that some GMR and TMR elements tend to change behavior after high temperature storage. Thus, it would be desirable to provide a GMR or a TMR element for which linearity irregularities are reduced and for which high temperature storage has a reduced effect.

Conventional GMR and TMR elements, and, in particular, spin valves, are known to also have an undesirable hysteresis behavior, which reduces their accuracy of magnetic field or current measurements. Thus, it would also be desirable to provide a GMR or TMR element with reduced hysteresis.

Conventional GMR and TMR elements, and, in particular, spin valves, are also known to have a magnetic asymmetry that can result in a non-fifty percent duty cycle of an output signal. Thus, it would be desirable to provide a GMR or a TMR element with an improved magnetic symmetry.

SUMMARY

The present invention provides a GMR or a TMR element (or any spin electronics magnetoresistance element) for which linearity irregularities are reduced, hysteresis behavior is strongly reduced, and for which high temperature and high field storage conditions have a reduced effect. In some embodiments, the present invention can also provide a GMR or a TMR element (or any spin electronics magnetoresistance element) with an improved magnetic symmetry.

In accordance with an example useful for understanding an aspect of the present invention, a magnetoresistance element deposited upon a substrate can include:

an even number of free layer structures, the even number of free layer structures comprising first and second free layer structures;

an even number of spacer layers, the even number of spacer layers comprising first and second spacer layers; and

an even number of pinned layers structures, the even number of pinned layer structures comprising first and second pinned layer structures, wherein the even number of free layer structures, the even number of spacer layers, and the even number of pinned layer structures are disposed in a stack of layers, wherein a first spacer layers is comprised of a first material with a first thickness, the first material and the first thickness selected to result in a first selected one of an antiferromagnetic coupling or a ferromagnetic coupling between the first pinned layer structures and the first free layer structure, and wherein the second spacer layer is comprised of a second material with a second thickness, the second material and the second thickness selected result in a second selected one of an antiferromagnetic coupling or a ferromagnetic coupling between the second pinned layer structures and the second free layer structures.

In some embodiments, the above magnetoresistance element can include one or more of the following aspects in any combination.

In some embodiments of the above magnetoresistance element, the first and second spacer layers are comprised of Ru.

In some embodiments of the above magnetoresistance element, the first selected thickness is in the range of about 1.0 nm to about 1.7 nm or about 2.3 nm to about 3.0 nm, and wherein the second selected thickness is in the range of about 1.7 nm to about 2.3 nm or about 3.0 nm to about 3.7 nm.

In some embodiments of the above magnetoresistance element, the second selected thickness is in the range of about 1.0 nm to about 1.7 nm or about 2.3 nm to about 3.0 nm, and wherein the first selected thickness is in the range of about 1.7 nm to about 2.3 nm or about 3.0 nm to about 3.7 nm.

In some embodiments of the above magnetoresistance element, the first and second pinned layer structures each consist of one respective pinned layer.

In some embodiments of the above magnetoresistance element, the first and second pinned layer structures each comprise a respective synthetic antiferromagnetic (SAF) structure.

In some embodiments of the above magnetoresistance element, the first and second pinned layer structures each consist of one respective pinned layer.

In some embodiments of the above magnetoresistance element, the first and second pinned layer structures each comprise a respective synthetic antiferromagnetic (SAF) structure.

In some embodiments, the above magnetoresistance element can include:

an odd number of pinning layers comprising at least first, second, and third pinning layers, the first and second pinning layers magnetically coupled to the first and second pinned layer structures, respectively;

wherein the even number of pinned layer structures further comprise third and fourth pinned layer structures, wherein the third pinning layers is a common pinning layer magnetically coupled to both of the third and fourth pinned layer structures.

In some embodiments of the above magnetoresistance element, the first and second pinning layers are comprised of PtMn.

In some embodiments of the above magnetoresistance element, the third pinning layer is comprised of PtMn.

In some embodiments of the above magnetoresistance element, annealed magnetic directions of the first and second pinning layers are parallel to each other, and wherein an annealed magnetic direction of the third pinning layer is ninety degrees relative to the annealed magnetic directions of the first and second pinning layers.

In some embodiments of the above magnetoresistance element, at least a portion of the magnetoresistance element has a yoke shape.

In some embodiments of the above magnetoresistance element, a length (L) of the yoke shape and a length (d) of the lateral arms of the yoke shape are each at least three times a width (w) of the yoke shape, and the width (w) of the yoke shape is between about one μm and about twenty μm, wherein the length (L) is a longest dimension of the yoke shape.

In accordance with another example useful for understanding an aspect of the present invention, a method of fabricating a magnetoresistance element can include:

depositing the magnetoresistance element upon a substrate, the magnetoresistance element comprising:

-   -   an even number of free layer structures, the even number of free         layer structures comprising first and second free layer         structures;     -   an even number of spacer layers, the even number of spacer         layers comprising first and second spacer layers; and     -   an even number of pinned layers structures, the even number of         pinned layer structures comprising first and second pinned layer         structures, wherein the even number of free layer structures,         the even number of spacer layers, and the even number of pinned         layer structures are disposed in a stack of layers, wherein a         first spacer layers is comprised of a first material with a         first thickness, the first material and the first thickness         selected to result in a first selected one of an         antiferromagnetic coupling or a ferromagnetic coupling between         the first pinned layer structures and the first free layer         structure, and wherein the second spacer layer is comprised of a         second material with a second thickness, the second material and         the second thickness selected result in a second selected one of         an antiferromagnetic coupling or a ferromagnetic coupling         between the second pinned layer structures and the second free         layer structures, wherein the method further comprises:

annealing the magnetoresistance element.

In some embodiments, the above method can include one or more of the following aspects in any combination.

In some embodiments of the above method, the first and second spacer layers are comprised of Ru.

In some embodiments of the above method, the first selected thickness is in the range of about 1.0 nm to about 1.7 nm or about 2.3 nm to about 3.0 nm, and wherein the second selected thickness is in the range of about 1.7 nm to about 2.3 nm or about 3.0 nm to about 3.7 nm.

In some embodiments of the above method, the second selected thickness is in the range of about 1.0 nm to about 1.7 nm or about 2.3 nm to about 3.0 nm, and wherein the first selected thickness is in the range of about 1.7 nm to about 2.3 nm or about 3.0 nm to about 3.7 nm.

In some embodiments of the above method, the first and second pinned layer structures each consist of one respective pinned layer.

In some embodiments of the above method, the first and second pinned layer structures each comprise a respective synthetic antiferromagnetic (SAF) structure.

In some embodiments of the above method, the first and second pinned layer structures each consist of one respective pinned layer.

In some embodiments of the above method, the first and second pinned layer structures each comprise a respective synthetic antiferromagnetic (SAF) structure.

In some embodiments of the above method, the deposited magnetoresistance element further comprises:

an odd number of pinning layers comprising at least first, second, and third pinning layers, the first and second pinning layers magnetically coupled to the first and second pinned layer structures, respectively;

wherein the even number of pinned layer structures further comprise third and fourth pinned layer structures, wherein the third pinning layers is a common pinning layer magnetically coupled to both of the third and fourth pinned layer structures.

In some embodiments of the above method, the first and second pinning layers are comprised of PtMn.

In some embodiments of the above method, the third pinning layer is comprised of PtMn.

In some embodiments of the above method, the annealing comprises:

annealing magnetic directions of the first and second pinning layers parallel to each other; and

annealing a magnetic direction of the third pinning layer to be ninety degrees relative to the annealed magnetic directions of the first and second pinning layers.

In some embodiments, the above method further comprises patterning the magnetoresistance element to have yoke shape.

In some embodiments of the above method, a length (L) of the yoke shape and a length (d) of the lateral arms of the yoke shape are each at least three times a width (w) of the yoke shape, and the width (w) of the yoke shape is between about one μm and about twenty μm, wherein the length (L) is a longest dimension of the yoke shape.

In accordance with another example useful for understanding an aspect of the present invention, a magnetoresistance element can include:

a substrate;

a first pinned layer structure disposed over the substrate;

a first spacer layer disposed over the first pinned layer structure;

a first free layer structure disposed over the first spacer layer

an antiferromagnetic layer disposed over the first free layer structure

a second free layer disposed over the antiferromagnetic layer;

a second spacer layer disposed over the second free layer structure; and

a second pinned layer structure disposed over the second spacer layer;

wherein the first spacer layer is comprised of a first selected material with a first selected thickness to result in a first selected one of an antiferromagnetic coupling or a ferromagnetic coupling between the first pinned layer and the first free layer, and wherein the second spacer layer is comprised of the first selected material with a second different selected thickness to result in a second different one of the antiferromagnetic coupling of the ferromagnetic coupling between the second pinned layer and the second free layer.

In some embodiments, the above magnetoresistance element can include one or more of the following aspects in any combination.

In some embodiments of the above magnetoresistance element, the first and second spacer layers are comprised of Ru.

In some embodiments of the above magnetoresistance element, the first selected thickness is in the range of about 1.0 nm to about 1.7 nm or about 2.3 nm to about 3.0 nm, and wherein the second selected thickness is in the range of about 1.7 nm to about 2.3 nm or about 3.0 nm to about 3.7 nm.

In some embodiments of the above magnetoresistance element, the second selected thickness is in the range of about 1.0 nm to about 1.7 nm or about 2.3 nm to about 3.0 nm, and wherein the first selected thickness is in the range of about 1.7 nm to about 2.3 nm or about 3.0 nm to about 3.7 nm.

In some embodiments of the above magnetoresistance element, the first and second pinned layer structures each consist of one respective pinned layer.

In some embodiments of the above magnetoresistance element, the first and second pinned layer structures each comprise a respective synthetic antiferromagnetic (SAF) structure.

In some embodiments of the above magnetoresistance element, the first and second pinned layer structures each consist of one respective pinned layer.

In some embodiments of the above magnetoresistance element, the first and second pinned layer structures each comprise a respective synthetic antiferromagnetic (SAF) structure.

BRIEF DESCRIPTION OF THE DRAWINGS

The foregoing features of the invention, as well as the invention itself may be more fully understood from the following detailed description of the drawings, in which:

FIG. 1 is a graph showing an ideal and an actual transfer characteristic of a giant magnetoresistance (GMR) element;

FIG. 2 is a block diagram showing layers of a conventional prior art GMR element with a single pinned arrangement;

FIG. 3 is a block diagram showing layers of a conventional prior art GMR element with a double pinned arrangement;

FIG. 4 is a block diagram showing layers of an example of a magnetoresistance element having a particular double pinned arrangement;

FIG. 5 is a top view diagram of magnetic field sensing element having a yoke shape that, in some embodiments, can describe a shape of the magnetoresistance element of FIG. 4, 10, or 11;

FIG. 6 is a block diagram of a magnetoresistance element magnetic field sensor placed above a magnetic target for rotation speed measurement; and

FIG. 7 is a flow chart showing an example of process steps that can be used to form the double pinned GMR element of FIGS. 4, 5, 10, and 11;

FIGS. 8 and 9 are flow charts showing examples of alternate process steps that can be used to form the double pinned GMR element of FIGS. 4, 5, 10, and 11,

FIG. 10 is a block diagram showing layers of another example of a magnetoresistance element having a particular double pinned arrangement having a generally reverse stackup from the arrangement of FIG. 4;

FIG. 11 is a block diagram showing layers of yet another example of a magnetoresistance element having a particular double pinned arrangement;

FIG. 12 is a block diagram showing layers of another example of a magnetoresistance element having a particular double pinned arrangement having a generally reverse stackup from the arrangement of FIG. 11;

FIG. 13 is a graph showing a representative transfer curve of the magnetoresistance element of FIG. 4 taken with magnetic fields in a transverse direction;

FIG. 14 is a graph showing a representative transfer curve of the magnetoresistance element of FIG. 4 taken with magnetic fields in a longitudinal direction;

FIG. 15 is a graph showing a representative transfer curve of the magnetoresistance element of FIG. 10 having the generally reverse stackup, a bias in the opposite direction with respect to FIG. 13, and taken with magnetic fields in a transverse direction;

FIG. 16 is a graph showing a representative transfer curve of the magnetoresistance element of FIG. 10 having the generally reverse stackup, a bias in the opposite direction with respect to FIG. 14, and taken with magnetic fields in a longitudinal direction;

FIG. 17 is a block diagram showing layers of an example of a magnetoresistance element having a double (or dual) spin valve stack;

FIG. 18 is a graph showing a representative transfer curve of the magnetoresistance element of FIG. 17 taken with magnetic fields in a transverse direction;

FIG. 19 is a graph showing a representative transfer curve of the magnetoresistance element of FIG. 17 taken with magnetic fields in a longitudinal direction;

FIG. 20 is a block diagram showing layers of another example of a magnetoresistance element having a different double spin valve stack; and

FIG. 21 is a block diagram layers of a prior art magnetoresistance element having a double spin valve arrangement.

DETAILED DESCRIPTION

Before describing the present invention, it should be noted that reference is sometimes made herein to GMR or TMR elements having particular shapes (e.g., yoke shaped). One of ordinary skill in the art will appreciate, however, that the techniques described herein are applicable to a variety of sizes and shapes.

As used herein, the term “anisotropy” or “anisotropic” refer to a particular axis or direction to which the magnetization of a ferromagnetic or ferrimagnetic layer tends to orientate when it does not experience an additional external field. An axial anisotropy can be created by a crystalline effect or by a shape anisotropy, both of which allow two equivalent directions of magnetic fields. A directional anisotropy can also be created in an adjacent layer, for example, by an antiferromagnetic layer, which allows only a single magnetic field direction along a specific axis in the adjacent layer.

In view of the above, it will be understood that introduction of an anisotropy in a magnetic layer results in forcing the magnetization of the magnetic layer to be aligned along that anisotropy in the absence of an external field. In case of a GMR or TMR element, a directional anisotropy provides an ability to obtain a coherent rotation of the magnetic field in a magnetic layer in response, for example, to an external magnetic field, which has the property of suppressing the hysteresis behavior of the corresponding element.

As used herein, the term “magnetic field sensing element” is used to describe a variety of electronic elements that can sense a magnetic field. A magnetoresistance element is but one type of magnetic field sensing elements.

As used herein, the term “magnetic field sensor” is used to describe a circuit that uses a magnetic field sensing element, generally in combination with other circuits. Magnetic field sensors are used in a variety of applications, including, but not limited to, an angle sensor that senses an angle of a direction of a magnetic field, a current sensor that senses a magnetic field generated by a current carried by a current-carrying conductor, a magnetic switch that senses the proximity of a ferromagnetic object, a rotation detector that senses passing ferromagnetic articles, for example, magnetic domains of a ring magnet, and a magnetic field sensor that senses a magnetic field density of a magnetic field.

Structures and methods described herein apply to both GMR and TMR magnetoresistance elements. However, it should be appreciated that the same or similar structures and methods can apply to other spin electronics magnetoresistance elements, either now known or later discovered. This includes in particular oxide based spin electronics structures.

Referring now to FIG. 1, a graph 100 has a horizontal axis with a scale in units of magnetic field in milliTesla (mT) and a vertical axis with a scale in units of resistance in arbitrary units.

A curve 102 is representative of a transfer function of an ideal GMR element, i.e., resistance versus magnetic field experienced by the GMR element. The transfer function 102 has a linear region 102 a between an upper saturation point 102 b and a lower saturation point 102 c. Regions 102 d, 102 e are in saturation. It should be understood that the linear region 102 a is an ideal linear region. Furthermore an ideal GMR element presents the same value of resistance for a given field independently of its magnetic history.

Steps, e.g., a step 104, are representative of an actual transfer function of the GMR element. Beyond the saturation points 102 b, 102 c, the actual transfer function represented by the steps 104 merges with the saturation regions 102 d, 102 e.

The steps 104 are not desirable. The steps 104 result from magnetic behavior of magnetic domains within a so-called free layer in a GMR element. Behavior of the free layer is described more fully below in conjunction with FIG. 2.

While the steps 104 are shown to be regular steps with equal spacing and equal step heights, the steps 104 can also be irregular, with unequal spacing and unequal step heights (i.e., amplitudes). The steps usually correspond to local hysteretic and on reproducible local rotation of the free layer.

Referring now to FIG. 2, a conventional prior art GMR element 200 includes a plurality of layers disposed over a substrate. An upper surface of the substrate is shown as a lowermost line at the bottom of FIG. 2.

On the left side of FIG. 2, each layer is identified by functional name. On the right side or FIG. 2 are shown magnetic characteristics of sub-layers that can form the functional layers. In general, magnetic materials can have a variety of magnetic characteristics and can be classified by a variety of terms, including, but not limited to, ferromagnetic, antiferromagnetic, and nonmagnetic. Description of the variety of types of magnetic materials is not made herein in detail. However, let it suffice here to say, that a ferromagnetic material is one in which magnetic moments of atoms within the ferromagnetic material tend to, on average, align to be both parallel and in the same direction, resulting in a nonzero net magnetic magnetization of the ferromagnetic material.

Most materials like copper, silver, and gold are diamagnetic materials, which do not exhibit a net magnetization. These materials tend to present an extremely weak magnetization opposite and proportional to an applied (external) magnetic field. Diamagnetic materials are also called nonmagnetic materials.

An antiferromagnetic material is one in which magnetic moments within the antiferromagnetic material tend to, on average, align to be parallel, but in opposite directions, resulting in a zero net magnetization.

As shown, the conventional prior art GMR element 200 can include a seed layer 202 disposed over the substrate, an antiferromagnetic pinning layer 204 disposed over the seed layer 202, and a pinned layer 206 disposed over the antiferromagnetic pinning layer 204. The pinned layer 206 can be comprised of a first ferromagnetic pinned layer 206 a, a second ferromagnetic pinned layer 206 c, and a spacer layer 206 b disposed there between.

The conventional GMR element 200 can also include a spacer layer 208 disposed over the second ferromagnetic pinned layer 206 c, and a free layer 210 disposed over the spacer layer 208. The spacer layer 206 b is a nonmagnetic metallic layer. The spacer 208 is also a nonmagnetic layer, which can be metallic for GMR or insulating for TMR. The free layer 210 can be comprised of a first ferromagnetic free layer 210 a and a second ferromagnetic free layer 210 b.

A cap layer 212 can be disposed over the free layer 210 to protect the GMR element 200.

Examples of thicknesses of the layers of the conventional prior art GMR element 200 are shown in nanometers. Examples of materials of the layers of the conventional prior art GMR element are shown by atomic symbols.

Within some layers, arrows are shown that are indicative or directions of magnetic field directions of the layers when the GMR element 200 does not experience an external magnetic field. Arrows coming out of the page are indicated as dots within circles and arrows going into the page are indicated as crosses within circles.

Taking the layers from the bottom upward, the seed layer 202 is used to provide a regular crystalline structure upon the substrate that affects crystal properties of layers above.

With regard to the antiferromagnetic pinning layer 204, sub-layers (i.e., layer portions) within the antiferromagnetic pinning layer 204 tend to have magnetic fields that point in alternating different directions indicated by right and left arrows, resulting in the antiferromagnetic pinning layer having a net magnetic field of zero. A top surface of the antiferromagnetic pinning layer 204 tends to have a magnetic moment pointing in one direction, here shown to the left.

With regard to the pinned layer 206, the first ferromagnetic pinned layer 206 a tends to couple to the top surface of the antiferromagnetic pinning layer 204, and thus, the magnetic field in the first ferromagnetic pinned layer 206 a can by aligned in parallel to the magnetic moments at the top surface of the antiferromagnetic pinning layer 204, here shown to the left.

Due to the presence of the spacer layer 206 b between the first and second ferromagnetic pinned layers 206 a, 206 c the second ferromagnetic pinned layer 206 c tends to couple antiferromagnetically with the first ferromagnetic pinned layer 206 a, and thus, it has a magnetic field pointing in the other direction, here shown pointing to the right. The combination of the three layers 206 a, 206 b, 206 c can be referred to as a synthetic antiferromagnetic structure or layer.

The first and second free layers 210 a, 210 b have respective magnetic fields pointing out of the page in the absence of an external magnetic field. This pointing direction can be achieved by creating a specific anisotropy along a direction pointing out of the page. That anisotropy can be created by a shape of the GMR element. For example, the anisotropy can be created by patterning the GMR element 200 (top view) to have a yoke shape, or by a crystalline or a magnetic anisotropy. A yoke shape is more fully described below in conjunction with FIG. 5. By created the yoke shape, the free layer 210 has a preferential axis (the yoke axis). If the yoke axis is perpendicular to the reference magnetization a crossed anisotropy can be achieved, which allows obtaining a linear response on a field extension of the order of the free layer anisotropy.

In operation, when the conventional GMR element 200 is exposed to an external magnetic field pointing in a direction of an arrow 214, the magnetic fields in the ferromagnetic free layers 210 a, 210 b tend to rotate to the right to become more aligned (or fully aligned, i.e., pointing to the right) with the magnetic field pointing direction in the second ferromagnetic pinned layer 206 c. However, the magnetic fields in the pinned layer 206 are pinned by the antiferromagnetic pinning layer and do not rotate. The amount of rotation of the magnetic fields in the ferromagnetic free layers 210 a, 210 b depends upon the magnitude of the external magnetic field. The increased alignment of the magnetic fields in the ferromagnetic free layers 210 a, 210 b with the direction of the magnetic field in the second ferromagnetic pinned layer 206 c tends to make a resistance of the GMR element 200 lower. In particular, resistance tends to vary primarily in the first free layer 210 a, in the second (Cu) spacer layer 208, and in the second ferromagnetic (e.g., CoFe) pinned layer 206 c.

Conversely, when the GMR element is exposed to an external field pointing opposite to the direction of the arrow 214, the magnetic fields in the free layer 210 tend to rotate to the left to become more anti-aligned (or fully anti-aligned, i.e., pointing to the left) with the magnetic field pointing direction in the second ferromagnetic pinned layer 206 c. The amount of rotation depends upon the magnitude of the external magnetic field. The increased anti-alignment of the magnetic fields in the ferromagnetic free layers 210 a, 210 b with the direction of the magnetic field in the second ferromagnetic pinned layer 206 c tends to make a resistance of the GMR element 200 higher.

In view of the above, it will be understood that, referring briefly to FIG. 1, in the absence of an external magnetic field, a resistance of the GMR element 200 is at the center of the linear region 102 a, and the resistance can move to the right or to the left on the transfer characteristic curve 102 (i.e., lower or higher) depending upon a direction of the external magnetic field 214. When full alignment or full anti-alignment of layers is achieved, the GMR element 200 will be in the lower saturation region 102 e or the upper saturation region 102 d, respectively.

In general, the ferromagnetic free layers 210 a, 210 b tend to naturally have a plurality of magnetic domains, including, but not limited to, a first plurality of magnetic domains with magnetic fields pointing in a first direction and a second plurality of magnetic domains with magnetic fields pointing in one or more other directions. The first plurality of magnetic domains in the ferromagnetic free layers 210 a, 210 b have magnetic field pointing directions that are aligned with the net magnetic field of the free layer 210, shown to be coming out of the page when the GMR element 200 is not exposed to an external magnetic field, but which can rotate as the GMR element 200 is exposed to a magnetic field. As described above, the magnetic field pointing direction of the first plurality of magnetic domains rotates in response to the external magnetic field. The second plurality of magnetic domains tends to have magnetic field pointing directions that point in one or more other directions.

Simply stated, with regard to the steps 104 of FIG. 1, each step is generated when one or more of the magnetic domains that are not within the first plurality of magnetic domains (e.g., that are within the second plurality of magnetic domains), i.e., one or more of the magnetic domains with magnetic fields not pointing in the direction of the net magnetic field in the ferromagnetic free layers 210 a, 210 b, suddenly snaps (i.e., jumps) in direction to become aligned with the net magnetic field pointing direction of the magnetic field in the ferromagnetic free layers 210 a, 210 b, wherever the net field in the ferromagnetic free layers 210 a, 210 b may be pointing (i.e., may have rotated) in response to an external magnetic field. However, it is also possible that one or more of the magnetic domains with magnetic fields not pointing in the direction of the net magnetic field in the ferromagnetic free layers 210 a, 210 b more slowly transitions in direction to become aligned with the net magnetic field pointing direction of the magnetic field in the ferromagnetic free layers 210 a, 210 b, in which case one or more of the steps of FIG. 1 would be less steep than those shown, but still undesirable. Thus, it would be desirable to reduce a number of magnetic domains in the free layer 210 that point in directions other than the direction of the net magnetic field in the free layer 210 (i.e., reduce the quantity of magnetic domains within the second plurality of magnetic domains). This reduction would result in fewer steps 104, smaller steps 104, or no steps 104.

In order to reduce the number of magnetic domains in the free layer 210 that point at directions other than the direction of the net magnetic field of the free layer, i.e., in order to reduce the number of magnetic domains that point in directions other than out of the page, an external biasing magnet can be used. As an alternative, a plurality of layers can be added to the basic GMR element 200 in order to achieve an intra-stack magnetic bias with a so-called “double pinned” arrangement.

Referring now to FIG. 3, a conventional prior art double pinned GMR element 300 can include a nonmagnetic seed layer 302, an antiferromagnetic pinning layer 304 disposed over the seed layer 302, a pinned layer 306 disposed over the pinning layer 304, a spacer layer 308 disposed over the pinned layer 306, and a free layer 310 disposed over the spacer layer. In some arrangements, the free layer 310 can be comprised of two ferromagnetic free layers 310 a, 310 b. In some arrangements, the spacer layer 308 is a nonmagnetic layer.

The double pinned GMR element 300 can further include a spacer layer 312 disposed over the free layer 310, a second pinned layer 314 disposed over the spacer layer 312, a second pinning layer 316 disposed over the second pinned layer 314, and a nonmagnetic cap layer 318 disposed over the second pinning layer 316. In some arrangements, the spacer layer 312 is a nonmagnetic layer.

Examples of thicknesses of the layers of the GMR element 300 are shown in nanometers. Examples of materials of the layers of the GMR element 300 are shown by atomic symbols.

The prior art double pinned GMR element 300 achieves a magnetostatic field created by the second pinned layer 314. The second pinned layer 314 layer is coupled ferromagnetically to the bottom surface of a second antiferromagnetic pinning layer 316, and thus, the magnetic field in the second pinned layer 314 points in the same direction as the magnetic moments at the bottom surface of the antiferromagnetic pinning layer 316, here shown pointing into the page.

The material used for the second antiferromagnetic pinning layer 316 is different from the one used for the first antiferromagnetic pinning layer 304. In this way the magnetization of the two layers 304, 316 can be manipulated independently by exploiting different blocking temperatures of the two materials (below 230° C. for IrMn and well above 250° C. for PtMn).

The second pinned layer 314 has a magnetic field oriented, here shown to be pointing into the page, to be perpendicular to the magnetic field of the first pinned layer 306. In particular, the pointing direction of the magnetic field created by the second pinned layer 314 and experienced by the free layer 310 causes a reduction in the number of magnetic domains in the free layer 310 that point in directions other than the direction of the net magnetic field of the free layer 310, e.g., a reduction in the number of magnetic domains that point in directions other than out of the page.

A thickness of the spacer layer 312 is chosen to provide a desired magnetic coupling strength between the second pinned layer 314 and the free layer 310. In some embodiments, the thickness of the Ta of the spacer layer 312 is only a few Angstroms, and the coupling takes places also through pinholes in the spacer layer 312. It will be understood that a thickness of a deposition of only a few angstroms is difficult to control, and pinhole density is also difficult to control. Thus, the amount of magnetic coupling between the second pinned layer 314 and the free layer 310 is difficult to control.

For a GMR element, the spacer 308 is a metallic nonmagnetic layer (usually Copper). For a TMR element, the spacer 308 is an insulating nonmagnetic layer (e.g., Al2O3 or MgO). Otherwise, the GMR element 300 can have layers the same as or similar to a comparable TMR element. Thus, a TMR element is not explicitly shown.

Referring now to FIG. 4, an example of a double pinned GMR element 400 includes a plurality of layers disposed over a substrate. An upper surface of the substrate is shown as a dark line at the bottom of FIG. 4.

On the left side of FIG. 4, each layer is identified by functional name. On the right side or FIG. 4 are shown magnetic characteristics of sub-layers that can form the functional layers.

Examples of thicknesses of the layers of the GMR element 400 are shown in nanometers. Examples of materials of the layers of the GMR element 400 are shown by atomic symbols.

In general, magnetic materials can have a variety of magnetic characteristics and can be classified by a variety of terms, including, but not limited to, ferromagnetic, antiferromagnetic, and nonmagnetic. Brief descriptions of these types of magnetic materials are given above.

As shown, the exemplary GMR element 400 can include some of the same layers described above for the prior art GMR element of FIG. 3. Like the prior art GMR element of FIG. 3, the exemplary GMR element 400 can include a seed layer 402 disposed over the substrate, an antiferromagnetic pinning layer 404 disposed over the seed layer 402, and a pinned layer 406 disposed over the antiferromagnetic pinning layer 404. However, in some embodiments, the pinned layer 406 can be comprised of a first ferromagnetic pinned layer 406 a, a second ferromagnetic pinned layer 406 c, and a spacer layer 406 b disposed therebetween. In some embodiments, the spacer layer 406 b is comprised of a nonmagnetic material.

In some other embodiments, the pinned layer 406 can instead be comprised of one pinned layer, the same as or similar to the pinned layer 306 of FIG. 3.

Due to the presence of the spacer 406 b between the first and second ferromagnetic pinned layers 406 a, 406 c, the second ferromagnetic pinned layer 406 c tends to couple antiferromagnetically with the first ferromagnetic pinned layer 406 a, and thus, it has a magnetic field pointing in the other direction, here shown pointing to the right. As described above, the combination of the three layers 406 a, 406 b, 406 c can be referred to as a synthetic antiferromagnetic structure or layer.

The exemplary GMR element 400 can also include a spacer layer 408 disposed over the second ferromagnetic pinned layer 406 c, and a free layer 410 disposed over the spacer layer 408. In some embodiments, the free layer 410 can be comprised of a first ferromagnetic free layer 410 a disposed under a second ferromagnetic free layer 410 b. In some embodiments, the spacer layer 408 is comprised of a nonmagnetic material (e.g., conductive Cu for GMR or an insulating material for TMR).

Like the prior art GMR element 300 of FIG. 3, the GMR element 400 of FIG. 4 can further include a spacer layer 412 disposed over the second ferromagnetic free layer 410 b, and a second pinned layer 414 disposed over the spacer layer 412. In some embodiments, the second pinned layer 414 can be comprised of a ferromagnetic material. In some embodiments, the spacer layer 412 is comprised of a nonmagnetic material (e.g., Ru)

The GMR element 400 of FIG. 4 can further include a second antiferromagnetic pinning layer 416 disposed over the second pinned layer 414.

A cap layer 418 can be disposed at the top of the GMR element 400 to protect the GMR element 400.

Within some layers, arrows are shown that are indicative or directions of magnetic fields of the layers when the GMR element 400 does not experience an external magnetic field. Arrows coming out of the page are indicated as dots within circles and arrows going into the page are indicated as crosses within circles.

In some embodiments, the seed layer 402 is comprised of Ru or Ta, and the first antiferromagnetic pinning layer 404 is comprised of PtMn. In some embodiments, the first pinned layer 406 is comprised of the first ferromagnetic pinned layer 406 a comprised of CoFe, the spacer layer 406 b comprised of Ru, and the second ferromagnetic pinned layer 406 c comprised of CoFe. In some embodiments, the spacer layer 408 is comprised of Cu (or alternatively, Au, or Ag). In some embodiments, the first ferromagnetic free layer 410 a is comprised of CoFe and the second ferromagnetic free layer 410 b is comprised of NiFe. In some embodiments, the spacer layer 412 is comprised of Ru (or alternatively, Au, or Ag), the second pinned layer 414 is comprised of CoFe, the second antiferromagnetic pinning layer 416 is comprised of PtMn, and the cap layer 418 is comprised of Ta. However, other materials are also possible.

The spacer layer 412 being comprised of Ru (or Au, or Ag) allows realizable ranges of thicknesses (described below) of the spacer layer 412 to allow for partial pinning of the free layer 410. Partial pinning is described more fully below.

In some other embodiments, the first and second antiferromagnetic pinning layers 404 and 416 can be comprised of IrMn, FeMn, or any other type of antiferromagnetic material. PtMn or IrMn are shown in the figure, and PtMn is used in examples below. In some other embodiments, the second pinned layer 414 can instead be comprised of a plurality of sublayers, the same as or similar to the sublayers of the first pinned layer 406. In some other embodiments, the spacer layer 408 can be comprised of Ta or Cu.

A thickness of the spacer layer 412 is selected to provide a desired amount of (i.e., a partial) magnetic coupling between the second pinned layer 414 and the free layer 410. Also, the thickness of the spacer layer 412 is selected to provide a desired type of magnetic coupling between the second pinned layer 414 and the free layer 410, i.e., ferromagnetic coupling or antiferromagnetic coupling, or between ferromagnetic and antiferromagnetic coupling. Here, the coupling is shown to be ferromagnetic coupling, but, by selection of the thickness of the spacer layer 412, the coupling can be antiferromagnetic or between ferromagnetic and antiferromagnetic coupling. In other words, in the absence of an external magnetic field it is possible for a direction of magnetic fields of the free layers 410 to be rotated either as shown (out of the page) or into the page, depending upon a selected thickness of the spacer layer 412. This characteristic will be shown to be useful in the magnetoresistance elements described below in conjunction with FIGS. 17 and 20.

In some embodiments for which the spacer layer 412 is comprised of Ru, the thickness of the spacer layer 412 is selected to be within a range of about 0.1 to about 4 nm, but preferably between about 0.9 and 4.0 nm for robustness of the manufacturing process, i.e., thick enough that the spacer layer 412 can be deposited with repeatable and reliable thickness. In some embodiments, a thickness of the spacer layer 412 is greater than 0.5 nm, or greater than 0.6, 0.7, 0.8, 0.9, 1.0, or 2.0 nm, i.e., greater than a thickness of the spacer layer 312 of the prior art double pinned GMR element 300 of FIG. 3.

Taking CoFe and NiFe to have similar magnetic properties, it will be recognized that the layers of materials above the first ferromagnetic free layer 410 a and below the first ferromagnetic free layer 410 a are similar, but in reversed order, namely, NiFe (or CoFe)/Ru/CoFe/PtMn. However, it is desired that the spacer layer 406 b provides high coupling between surrounding layers, thus it is thin, while it is desired that the spacer layer 412 provide less coupling between surrounding layers, thus it is thicker.

Ru is well suited for the spacer layer 412 because it allows antiferromagnetic or ferromagnetic coupling (also called Ruderman Kittel Kasuya Yoshida or RKKY coupling) between surrounding layers, according to the Ru thickness. In essence, the Ru material permits coupling through it, as opposed to in spite of it. This allows for a thicker Ru layer 412, with a range of achievable thickness values, to achieve and to tune the desired partial pinning of the free layer 410. Partial pinning is more fully described above and below.

In contrast, it should be understood that the Ta spacer layer 312 of FIG. 3 is only used as a nonmagnetic spacer layer and does not provide RKKY coupling. In essence, the Ta spacer layer 312 only decouples the free layer 310 from the pinned layer 314. However, as described above, the Ru spacer layer 412 of FIG. 4 provides RKKY coupling between the free layer 410 and the pinned layer 414.

In some embodiments, the thickness of the Ru spacer layer 412 is selected to provide an RKKY coupling of between about −50 mT and about 50 mT. The RKKY coupling tends to be stable with respect to possible process drift, i.e., the amount of coupling tends to remain constant and stable even for a thickness change of about ten percent in the Ru layer due to manufacturing process variations or the like.

Operation of the layers 402-410 is discussed above in conjunction with similar layers in FIGS. 2 and 3.

The second pinned layer 414, having a pinned magnetic field pointing direction aligned with a pointing direction of the magnetic field in the free layer 410, tends to cause particular behavior within the free layer 410. In particular, the pointing direction of the magnetic field in the second pinned layer 414 causes a reduction in the number of magnetic domains in the free layer 410 that point at directions other than the direction of the net magnetic field of the free layer, i.e., a reduction in the number of magnetic domains that point in directions other than out of the page when in the presence of no external magnetic field.

As described above in conjunction with FIG. 2, in general, the ferromagnetic free layers 410 a, 410 b tend to naturally have a plurality of magnetic domains, including, but not limited to, a first plurality of magnetic domains with magnetic fields pointing in a first direction and a second plurality of magnetic domains with magnetic fields pointing in one or more directions different than the first direction. The first direction described above can be parallel to upper and lower surfaces of the free layer 410. The first plurality of magnetic domains have magnetic field pointing directions that are aligned with the net magnetic field of the free layer 410 shown to be coming out of the page when the GMR element 400 is not exposed to an external magnetic field, but which can rotate as the GMR element 400 is exposed to a magnetic field. As described above, the magnetic field pointing direction of the first plurality of magnetic domains in the free layer 410 rotates in response to an external magnetic field. The second plurality of magnetic domains will tend to have magnetic field pointing directions that point in the one or more directions different than the first direction.

Also as described above in conjunction with FIG. 2, with regard to the steps 104 of FIG. 1, each step is generated when one or more of the magnetic domains that are not within the first plurality of magnetic domains (e.g., that are within the second plurality of magnetic domains), i.e., one or more of the magnetic domains with magnetic fields not pointing in the direction of the net magnetic field in the free layer 410, suddenly snaps (or more slowly rotates) in direction to become aligned with the magnetic field pointing direction of the net magnetic field in the free layer 410, wherever the net magnetic field in the free layer 410 may be pointing (i.e., may have rotated) in response to an external magnetic field.

The second pinned layer 414 is operable to partially magnetically couple, through the spacer layer 412, to the free layer 410, to reduce a number of magnetic domains (i.e., to reduce a quantity of magnetic domains in the second plurality of magnetic domains) in the free layer 410 that point in a direction other than the first direction, i.e., other than the direction of the net magnetic field in the free layer 410 in the absence of an external magnetic field. This reduction results in fewer steps 104, smaller steps 104, or no steps 104. The reduction can include a reduction in a quantity of magnetic domains within the above second plurality of magnetic domains.

By partial pinning, it is meant that there is less magnetic coupling between the second pinned layer 414 and the free layer 410 than between the first pinned layer 406 and the free layer 410. An amount of partial pinning is determined in part by a material and a thickness of the spacer layer 412.

The PtMn first and second antiferromagnetic pinning layer 404, 416 can have a Neel temperature and a blocking temperature that are both above about three hundred degrees Celsius. This high temperature is important to eliminate loss of magnetic characteristics of the GMR element 400 in high temperature applications, for example, automobile applications.

While the layers of the GMR element are shown in a particular order, it should be understood that, in other embodiments, the layers 404, 406 (i.e., 406 a, 406 b, 406 c), and 408 can be exchanged with the layers 416, 414, 412, respectively. In some embodiments, all of the layers shown in FIG. 4, except for the seed layer and the cap layer, can be reversed in order from bottom to top, as shown below in conjunction with FIG. 10.

The coupling strength and hence the anisotropy amplitude is controlled by the nonmagnetic spacer layer 412 between the free layer 410 and the second pinned layer 414. In the prior art arrangement of FIG. 3, a very thin Ta spacer 312 is used. In manufacturing, it is difficult to control the thickness of the thin Ta spacer 312, and thus, it is difficult to control the amount of magnetic coupling between the second pinned layer 314 and the free layer 310 of FIG. 3. In contrast, the arrangement of FIG. 4 uses a different nonmagnetic spacer layer 412, allowing a strong RKKY coupling between the second pinned layer 414 and the free layer 410. Ru, Ag, or Au can be used for the spacer layer 412.

RKKY coupling decreases and switches between a maximum antiferromagnetic coupling and a maximum ferromagnetic coupling as the distance between the pinned layer 414 and the free layer 410 increases (i.e., as the thickness of the nonmagnetic spacer layer 412 is increased). A minima of couplings (referred to as a second minimum of coupling) appears between these maxima and occurs at ranges of thicknesses where the coupling can be tuned by way of selection of the thickness. In some embodiments, a material of the spacer layer 412 can be chosen around the second minimum of coupling (e.g., 1.3 nm for Ru), which allows a much more reproducible deposition process than currently used for the thin Ta spacer 312 of FIG. 2, which just decreases coupling rapidly with thickness.

For a GMR element, the spacer layer 408 is a metallic nonmagnetic layer (usually Copper). For a TMR element, the spacer layer 408 is an insulating nonmagnetic layer (e.g., Al2O3 or MgO). Otherwise, the GMR element 400 can have layers the same as or similar to a comparable TMR element. Thus, a TMR element is not explicitly shown.

Referring now to FIG. 5, in which like elements of FIG. 4 are shown having like reference designations, according to a specific embodiment, the magnetoresistance element 400 of FIG. 4, and also magnetoresistance elements described below in conjunction with FIGS. 10 and 11, can be formed in the shape of a yoke 500. A section line A-A shows the perspective of FIGS. 4, 10, and 11.

The yoke 500 has a main part 501, two arms 506, 508 coupled to the main part 501, and two lateral arms 512, 514 coupled to the two arms 506, 508, respectively. In some embodiments, the main part 501, the two arms 506, 508, and the two lateral arms 512, 514 each have a width (w). However, in other embodiments, the widths can be different.

A length (L) of the yoke 500 and a length (d) of the lateral arms 512, 514 of the yoke 500 are each at least three times the width (w) of the yoke 500, and the width (w) of the yoke 500 can be between about one μm and about twenty μm.

The yoke dimensions can be, for example, within the following ranges:

-   -   the length (L) of the main part 501 of the yoke 500 can be         between about ten μm and ten millimeters;     -   the length (l) of the arms 506, 508 of the yoke 500 can be at         least three times the width (w);     -   the width (w) of the yoke 500 can be between about one μm and         about twenty μm.

The arms 506, 508 of the yoke 500 are linked to the lateral arms 512, 514, which are parallel to the main part 501, and have a length l which is between about ¼ and ⅓ of the overall length (L).

In general, sensitivity of the magnetoresistance element 400 having the yoke shape 500 decreases with the width (w), and the low frequency noise of the magnetoresistance element 400 increases with the width (w).

The yoke shape offers better magnetic homogeneity in a longitudinally central area of the main part 501. This is due to the demagnetizing field of the yoke length which is mainly along the main part 501, and this induces an anisotropy of the free layer 410 of FIG. 4, which can be seen as a magnetization at zero field along the length of the yoke 500. If the pinned layer (e.g., 406 of FIG. 4) has a magnetic field perpendicular to the yoke (e.g., arrow 502), when an external field is applied in direction of the arrow 502, the free layer 410 magnetization rotates uniformly, i.e. without domain jumps. The homogeneous rotation of the magnetization of the free layer 410 results in a response curve without steps in the response (see, e.g., FIG. 1)

For a GMR element, the overall stack can be designed in a yoke shape, but for a TMR element, in some embodiments, only the free layer can have a yoke shape.

In other embodiments, the GMR or TMR elements 400 is not formed in the shape of a yoke, but is instead formed in the shape of a straight bar, e.g., having the dimensions L and w, and not having features associated with the dimensions l and d. For the bar shaped GMR or TMR element, still the section line A-A is representative of the cross sections of the GMR element 400 of FIG. 4 or the magnetoresistance elements of FIGS. 10 and 11.

Referring now to FIG. 6, a magnetic field sensor 600 can include one or more magnetoresistance elements. Here, four magnetoresistance elements, which can be of a type described above in conjunction with FIG. 4, or below in conjunction with FIG. 10, 11, 12, 17, or 20 are arranged over a common substrate. The four magnetoresistance elements can be arranged in a bridge. Other electronic components (not shown), for example, amplifiers and processors, i.e., an electronic circuit, can also be integrated upon the common substrate. In some embodiments, the electronic circuit can generate an output signal indicative of a movement, e.g., a rotation, of an object. e.g., 602.

A surrounding package (not shown) e.g., a plastic package, can surround or otherwise be included with the magnetic field sensor 600. Also, a leadframe (not shown) can be coupled to or otherwise be included with the magnetic field sensor 600.

The magnetic field sensor 600 can be disposed proximate to a moving magnetic object, for example, a ring magnet 602 having alternating north and south magnetic poles. The ring magnet 602 is subject to rotation.

The magnetic field sensor 600 can be configured to generate an output signal indicative of at least a speed of rotation of the ring magnet. In some arrangements, the ring magnet 602 is coupled to a target object, for example, a cam shaft in an engine, and the sensed speed of rotation of the ring magnet 602 is indicative of a speed of rotation of the target object.

While the magnetic field sensor 600 is used as a rotation detector, it should be understood that other similar magnetic field sensors, for example, current sensors, having one or more the magnetoresistance elements of FIG. 4, 10, 11, 12, 17, or 20 can also be realized.

It should be appreciated that FIG. 7 shows a flowchart corresponding to the below contemplated technique that would be implemented with semiconductor manufacturing equipment. Rectangular elements (typified by element 704 in FIG. 7), herein denoted “processing blocks,” represent process steps.

It will be appreciated by those of ordinary skill in the art that, unless otherwise indicated herein, the particular sequence of blocks described is illustrative only and can be varied without departing from the spirit of the invention. Thus, unless otherwise stated the blocks described below are unordered meaning that, when possible, the steps can be performed in any convenient or desirable order.

Referring now to FIG. 7, an exemplary process 700 for manufacturing a double pinned GMR element as in FIG. 4 above, begins at block 702, where the full stack 400 of FIG. 4, or the magnetoresistance elements of FIG. 10 or 11 below (also FIGS. 12, 17, 20), is deposited in sequential deposition steps. This deposition can be followed at block 704 by a patterning process. The patterning can result, for example, in the yoke shape of FIG. 5.

After the patterning of block 704, a first annealing is applied at block 706 to the processed wafer, where the direction of the magnetic field in the first pinned layer (e.g., 406 of FIG. 4), and also directions in the first antiferromagnetic layer (e.g., 404 of FIG. 4) are defined. Typically the annealing is performed at a temperature T1 with a magnetic field H1 applied parallel to the wafer and, for instance, parallel to the arrow 502 of FIG. 5. This annealing can have, for example, a one hour duration under a magnetic field of 1T at 295° C., but these values are adapted to the stack composition, i.e., layer materials.

After this first annealing of block 706, at block 708, a second annealing is performed to define the magnetization of the second pinned layer (e.g., 414 of FIG. 4) and of the second antiferromagnetic layer (e.g., 416 of FIG. 4), which provides a magnetic field in the second pinned layer and also in the second antiferromagnetic layer that are oriented perpendicular to the direction of the magnetic field in the first pinned layer (e.g., 406 of FIG. 4) and the directions in the first antiferromagnetic layer (e.g., 404 of FIG. 4). This annealing step can have, for example, a one hour duration, at a temperature T2, which can be equal to T1, and with a magnetic field H2 that is lower than the magnetic field H1. The magnetic field H2 can be applied in a direction parallel to the arrow 504 of FIG. 5. This step is meant to orientate the magnetization of the second pinned layer (e.g., 414 of FIG. 4) without changing the magnetization direction and value of the first pinned layer (e.g., 406 of FIG. 4).

Example values and examples of ranges of values are listed below in Table 1 for the double pinned layer arrangement of FIG. 4 having two PtMn pinning layers 404, 416.

TABLE 1 Value Typical Approximate Range T1 295° C. 260° C. to 320° C. H1 1 T ≧0.3 T Duration 1 1 Hour 30 minutes to 2 hours T2 300° C. 180° C. to 350° C. H2 80 mT 20 mT to 200 mT Duration 2 1 Hour 30 minutes to 5 hours

Referring now to FIGS. 8 and 9, in which like elements of FIG. 7 are shown having like reference designations, similar processes 800, 900 can be also applied according to the steps of FIG. 7 but in different orders as shown.

In all of the processes 700, 800, 900, the magnetic field H2 applied during the second annealing is smaller than H1 and applied in another direction, preferably perpendicularly to H1.

Referring now to FIG. 10, in which like elements of FIG. 4 are shown having like reference designation, a double pinned GMR element 1000 has layers 404, 406, 408, 412, 414 and 416 of FIG. 4 but reversed in stackup order from those described above in conjunction with FIG. 4. While the pinning layer 416 can again be comprised of PtMn, IrMn, FeMn, or any other type of antiferromagnetic material, PtMn or IrMn are shown in the figure, and IrMn is used in examples below. (PtMn is used for examples in conjunction with FIGS. 4 and 7-9).

Unlike the double pinned GMR element 400 of FIG. 4, the above described nonmagnetic layer 412, which provides the above-described desirable characteristics for partial pinning, is below rather than above the free layer 412.

It should be understood that the reversed stackup of the GMR element 1000 may be preferred when the pinning layer 416 is comprised of IrMn. For the GMR element 400 of FIG. 4, if IrMn were used for the pinning layer 416, it would be deposited on top of the CoFe pinned layer 414, which is not desirable. It has been identified that IrMn does not grow well, i.e., with a regular crystalline structure, when grown over a CoFe layer, alone or in combination with other layers. However, the IrMn layer 416 grows well over the seed layer 402.

In the double pinned GMR elements 400 and 1000 of FIGS. 4 and 10, respectively, it should be appreciated that the layers 406 a, 406 b, 406 c form a so-called “synthetic antiferromagnet” (SAF) structure, for which the layers 406 a, 406 c are antiferromagnetically coupled (i.e., have magnetic fields in opposite directions). Thus, the pinned layer 406 forms a SAF structure. In contrast, the pinned layer 414 is but a single layer.

It has been observed that a SAF structure used as a pinned layer is more stable that a pinned layer formed as a single layer. In particular, under very high temperature storage life (VTSL) conditions with a magnetic field (e.g., 180° C., 0.2 T) a single layer pinned layer tends to become aligned with or rotate toward a direction of the external magnetic field, even after the VTSL conditions are removed, and thus, can rotate from the direction in which it was originally annealed. The undesirable rotation can result in a less sensitive GMR element, or even in an insensitive GMR element over parts of its operating characteristic curve.

In contrast, it has also been observed that a SAF structure used as a pinned layer is more stable and tends to rotate less in the presence of the same VTSL conditions, and comes back to the original position more easily (i.e., reduced hysteresis). To this end, in FIG. 11 described below, the single layer pinned layer 414 of FIGS. 4 and 10 can be replaced with a SAF structure. Thus, the free layer 410 can be surrounded with two SAF structures used as two pinned layers.

Referring now to FIG. 11, in which like elements of FIGS. 4 and 10 are shown having like reference designations, a double pinned GMR element 1100 is like the double pinned GMR element 1000 of FIG. 10, except the single layer pinned layer 414 of FIG. 10 is replaced by a SAF structure 1102. In some embodiments, the SAF structure 1102 can be comprised of a first ferromagnetic pinned layer 1102 a, a second ferromagnetic pinned layer 1102 c, and a spacer layer 1102 b disposed therebetween. In some embodiments, the spacer layer 1102 b is comprised of a nonmagnetic material.

It should be apparent that the free layer 410 is surrounded by pinned layers 406, 1102, both of which are SAF structures. Spacer layers 412, 408 are disposed between the free layer 410 and the SAF structures 1102, 206, respectively.

It should also be apparent that an upper surface of the antiferromagnetic pinning layer 416 has a magnetic field reversed in direction from an upper surface of the pinning layer 416 of FIG. 10.

Spacer layers 406 b, 1102 b (also referred to herein and nonmagnetic layers) within the two SAF structures have a material and a thickness selected to result in strong antiferromagnetic coupling between surrounding ferromagnetic layers 406 a, 406 b and 1102 a, 1102 b.

It has been observed that the double pinned GMR element 1100 has a greater stability with respect to VTSL conditions than the double pinned GMR element 1000 of FIG. 10 or the double pinned GMR element 400 of FIG. 4.

As in the double pinned GMR element 1000 of FIG. 10, the above described nonmagnetic layer 412 that provides the above-described desirable characteristics for partial pinning, is below rather than above the free layer 412. However, in other embodiments, all layers between the cap layer 418 and the seed layer 402 can be reversed in position.

It should be apparent that a reversed stackup of all layers other than the seed layer 402 and the cap layer 418 can provide a double pinned GMR element similar to the double pinned GMR element of FIG. 4, but with the various layers reversed and still with the pinned layer 414 of FIG. 4 replaced by the SAF structure 1102 of FIG. 11.

While particular layer thicknesses are shown in FIGS. 4, 10, and 11, it will be understood that the thicknesses of some layers can be manipulated to provide a more sensitive double pinned GMR element.

Referring briefly to FIG. 7 above, typical values for annealing a double pinned layer arrangement of FIG. 11 having a PtMn pinning layer 404 and a PtMn pinning layer 416, i.e., two PtMn pinning layers, are shown below in Table 2.

For Table 2 and for the double pinned GMR element of FIG. 11, temperature T1, magnetic field H1, and duration 1, refer to annealing of the PtMn antiferromagnetic layer 404 and of the SAF structure 406. Temperature T2, magnetic field H2, and duration 2, refer to annealing of the PtMn antiferromagnetic layer 416 and of the SAF structure 1102.

TABLE 2 Value Typical Approximate Range T1 270° C. 250° C. to 320° C. H1 1 T ≧0.3 T Duration 1 1 Hour 30 minutes to 2 hours T2 160° C. 100° C. to 350° C. H2 1 T 50 mT to 1 T Duration 2 1 Hour 30 minutes to 5 hours

Referring again briefly to FIG. 7 above, typical values for annealing a double pinned layer arrangement of FIGS. 4, 10, and 11 having a PtMn pinning layer 404 and an IrMn pinning layer 416 are shown below in Table 3.

For Table 3 and for the double pinned GMR elements of FIGS. 4 and 10, temperature T1, magnetic field H1, and duration 1, refer to annealing of the PtMn antiferromagnetic layer 404 and of the pinned layer 406. Temperature T2, magnetic field H2, and duration 2, refer to annealing of the IrMn antiferromagnetic layer 416 and of the associated pinned layer 414.

For Table 3 and for the double pinned GMR element of FIG. 11, temperature T1, magnetic field H1, and duration 1, refer to annealing of the PtMn antiferromagnetic layer 404 and of the pinned (SAF) structure 406. Temperature T2, magnetic field H2, and duration 2, refer to annealing of the IrMn antiferromagnetic layer 416 and of the pinned (SAF) structure 1102.

TABLE 3 Value Typical Approximate Range T1 295° C. 280° C. to 320° C. H1 1 T ≧0.3 T Duration 1 1 Hour 30 minutes to 2 hours T2 160° C. 100° C. to 260° C. H2 1 T 50 mT to 2 T Duration 2 30 minutes 10 minutes to 2 hours

While double pinned GMR elements are described above, it should be understood that the double pinned arrangements can be part of a structure with additional pinning and/or pinned layers.

Referring now to FIG. 12, in which like elements of FIGS. 4 and 11 are shown having like reference designation, a double pinned GMR element 1200 has layers 404, 406, 408, 412, 1102 and 416 of FIG. 11 but reversed in stackup order from those described above in conjunction with FIG. 11. While the pinning layer 416 can again be comprised of PtMn, IrMn, FeMn, or any other type of antiferromagnetic material, PtMn or IrMn are shown in the figure, and IrMn is used in examples below. (PtMn is used for examples in conjunction with FIGS. 4 and 7-9).

Unlike the double pinned GMR element 1100 of FIG. 11, the above described nonmagnetic layer 412, which provides the above-described desirable characteristics for partial pinning, is above rather than below the free layer 410.

It should be understood that the non-reversed stackup of the GMR element 1100 may be preferred when the pinning layer 416 is comprised of IrMn. For the reversed stackup GMR element 1200 of FIG. 12, if IrMn were used for the pinning layer 416, it would be deposited on top of the CoFe pinned layer 1102 a, which is not desirable. It has been identified that IrMn does not grow well, i.e., with a regular crystalline structure, when grown over a CoFe layer, alone or in combination with other layers. However, the IrMn layer 416 grows well over the seed layer 402.

In the double pinned GMR elements 1100 and 1200 of FIGS. 11 and 12, respectively, it should be appreciated that the structures 406, 1102 form so-called “synthetic antiferromagnet” (SAF) structures as described above.

Referring now to FIG. 13, a graph 1300 has a horizontal axis with a scale in units of magnetic field in Oersteds and a vertical axis with a scale in units of resistance in ohms.

As used herein, when referring to magnetoresistance elements, the term “transverse” is used to refer to a magnetic field perpendicular to a longer dimension of the yoke 500 of FIG. 5, e.g., in a direction of the arrow 502 of FIG. 5. This direction can also be generally perpendicular to a direction of the magnetic field in the free layer or free layer structure 420, but subject to possible misalignment described above.

As used herein, when referring to magnetoresistance elements, the term “longitudinal” is used to refer to a magnetic field parallel to a longer dimension of the yoke 500 of FIG. 5, e.g., in a direction of the arrow 504 of FIG. 5. This direction can also be generally parallel to a direction of the magnetic field in the free layer or free layer structure 420, but also subject to possible misalignment described above.

Two curves 1302, 1304 identified as “forward” and “reverse,” respectively, are representative of transfer curves of magnetic fields in a transverse direction relative to the magnetoresistance element 400 of FIG. 4.

Whether transverse or longitudinal directions, curves identified herein, as “forward” and “reverse,” for the forward direction, are indicative of a magnetic field that sweeps in magnetic field strength from a positive value to a negative value. For the reverse direction, curves are indicative of a magnetic field that that sweeps in magnetic field strength from the negative value to the positive value, while maintaining a direction of either the transverse or longitudinal directions represented by the curves herein.

It can be seen that the forward and reverse transverse transfer curves 1302, 1304 of FIG. 13 are not symmetrical about a magnetic field of zero Oersteds. In general, the asymmetry can be caused by a misalignment of the pinned layer 406 of FIG. 4 with the transverse direction of the yoke 500 of FIG. 5, and a resulting misalignment of the free layer structure 410.

Referring now to FIG. 14, a graph 1400 has a horizontal axis with a scale in units of magnetic field in Oersteds and a vertical axis with a scale in units of resistance in ohms.

Two curves 1402, 1404 identified as “forward” and “reverse,” respectively, are representative of transfer curves of magnetic fields in a longitudinal direction relative to the magnetoresistance element 400 of FIG. 4. The two curves 1402, 1404 have a peak.

It can be seen that the forward and reverse longitudinal transfer curves of FIG. 14 are not symmetrical about a magnetic field of zero Oersteds, i.e., a peak is not at zero Oersteds. The asymmetry of the longitudinal transfer curves of FIG. 14 can result from the presence of the intra-stack magnetic bias of the double pinned arrangement 400 of FIG. 4, which is cancelled out when an external field with the same amplitude is applied in the opposite direction.

Referring now to FIG. 15, a graph 1500 has a horizontal axis with a scale in units of magnetic field in Oersteds and a vertical axis with a scale in units of resistance in ohms.

Two curves 1502, 1504 identified as “forward” and “reverse,” respectively, are representative of transfer curves of magnetic fields in a transverse direction relative to the magnetoresistance element 1000 of FIG. 10, i.e., for the reverse stackup of layers relative to the magnetoresistance element 400 of FIG. 4. However, for the forward and reverse transverse transfer curves 1502, 1504 of FIG. 15, the spacer layer 412 has a different thickness than that shown for the magnetoresistance element 1000, which is selected to achieve a different coupling of the pinned layer 412 to the free layer structure 410, i.e., in a direction into the page of the magnetoresistance element 1000 of FIG. 10. Different selected thickness of the spacer layer 412 and associated different couplings, i.e., ferromagnetic or antiferromagnetic, are described above in conjunction with FIG. 4. Still further details of thicknesses of the spacer layer 412 are described below in conjunction with FIGS. 17 and 20.

It can be seen that the forward and reverse transverse transfer curves 1502, 1504, respectively, of FIG. 15 are not symmetrical about a magnetic field of zero Oersteds. It can also be seen that the forward and reverse transverse transfer curves 1302, 1304 of FIG. 13 and the forward and reverse transverse transfer curves 1502, 1504 of FIG. 15 are offset from center in opposite directions, one to the left and one to the right.

Referring now to FIG. 16, a graph 1600 has a horizontal axis with a scale in units of magnetic field in Oersteds and a vertical axis with a scale in units of resistance in ohms.

Two curves 1602, 1604 identified as “forward” and “reverse,” respectively, are representative of transfer curves of magnetic fields in a longitudinal direction relative to the magnetoresistance element 1000 of FIG. 10, i.e., for the reverse stackup of layers relative to the magnetoresistance element 400 of FIG. 4. However, as described above in conjunction with FIG. 15, for the forward and reverse longitudinal transfer curves, the spacer layer 412 has a thickness selected to achieve a different coupling of the pinned layer 412 to the free layer structure 410, i.e., in a direction into the page of the magnetoresistance element 1000 of FIG.

It can be seen that the forward and reverse curves 1602, 1604, respectively, of FIG. 16 are not symmetrical about a magnetic field of zero Oersteds, i.e., a notch is not at zero Oersteds. It can also be seen that the forward and reverse longitudinal transfer curves 1404, 1404 of FIG. 14 and the forward and reverse transverse transfer curves 1602, 1604 of FIG. 16 (one a peak and one a notch) are offset from center in opposite directions, one to the left and one to the right.

The result of any of the transfer curves of FIGS. 13-16 is that, in the presence of a rotating magnetic field (rather than the fixed direction fields used in examples above), the resistance of the magnetoresistance elements 400 or 1000 of FIGS. 4 and 10, and resulting voltage when used in an electronic circuit, does not follow an undistorted sinusoidal characteristic. In essence, the resulting voltage can have a duty cycle other than fifty percent.

It should be understood that similar asymmetries of transfer functions can result from the double SAF magnetoresistance element 1100 of FIG. 11 and for the reversed double SAF magnetoresistance element 1200 of FIG. 12.

The non-fifty percent duty cycle can be undesirable. To provide a more consistent duty cycle near fifty percent, so called “dual spin valve” magnetoresistance elements are describe in FIGS. 17 and 20 below.

The dual spin valves described below also have other advantages described above in conjunction with FIGS. 4, 10, and 11 (and also 12). Namely, by incorporating dual spin valves with the partial pinning generated by a particular double pinned arrangement having Ru layers described above (e.g., 412), the noise of steps of the transfer function of FIG. 1 can be reduced or eliminated.

Referring now to FIG. 17, a dual spin valve magnetoresistance element 1700 includes a portion 1702 like a portion (not including seed layer 402 or cap layer 418) of the double pinned magnetoresistance element 400 of FIG. 4 and also a portion 1704 like a portion (not including seed layer 402 or cap layer 418) of the reversed double pinned magnetoresistance element 1000 of FIG. 10. A common antiferromagnetic pinning layer 1706 can be in the middle.

The dual spin valve magnetoresistance element 1700 can have two free layer structures, for which spacer layers 1708, 1710 have different thicknesses selected to result in different couplings to the two free layer structures so that the two free layer structures have magnetic fields with opposite directions as shown. The directions of the magnetic fields in the two free layer structures can be reversed from the direction shown.

In some embodiments, the spacer layer 1710 has a thickness that can be in one of two example ranges, e.g., about 1.0 nm to about 1.7 nm or about 2.3 nm to about 3.0 nm to result in a ferromagnetic coupling between the spacer layer 1710 and the adjacent lower free layer structure.

In some embodiments, the spacer layer 1708 has a thickness that can be in one of two example ranges, e.g., about 1.7 nm to about 2.3 nm or about 3.0 nm to about 3.7 nm to result in a antiferromagnetic coupling between the spacer layer 1708 and the adjacent upper free layer structure.

In some other embodiments, the two ranges can instead be about 0.7 nm to about 1.0 nm or about or about 3.0 nm to about 3.7 nm.

Thus, it will be appreciated that the two free layer structures have magnetic fields with nominal directions pointing in opposing directions. This is like the transfer curves of FIGS. 13 and 14 taken together with the transfer curves and FIGS. 15 and 16, associated with two separate magnetoresistance elements (400 and modified 1000).

In addition, by selection of thickness of the two spacer layers 1708, 1710, the two couplings, ferromagnetic and antiferromagnetic, can have about the same magnitude, but in opposite directions.

It should be further appreciated that operation of the dual spin valve magnetoresistance element 1700 operates very much like a series stack combination of the magnetoresistance elements 400 of FIG. 4 and 1000 of FIG. 10, but where two resulting spacer layers 1702, 1704 (412 of FIGS. 4 and 10) have selected thickness to result in a ferromagnetic coupling to the lower free layer structure and an antiferromagnetic coupling to the upper free layer structure.

In some alternate embodiments, the spacer layer 1708 can have the thickness of the spacer layer 1710 and vice versa.

The dual spin valve magnetoresistance element 1700 can have two synthetic antiferromagnetic (SAF) pinned structures and also two other pinned layers (i.e., single layer pinned layers).

The two synthetic antiferromagnetic (SAF) pinned structures and also the two other pinned layers are both referred to herein as pinned layer structures.

Referring now to FIG. 18, a graph 1800 has a horizontal axis with a scale in units of magnetic field in Oersteds and a vertical axis with a scale in units of resistance in ohms.

Two curves 1802, 1804 identified as “forward” and “reverse,” respectively, are representative of transfer curves of magnetic fields in a transverse direction relative to the dual spin valve magnetoresistance element 1700 of FIG. 17.

It can be seen that the forward and reverse transverse transfer curves 1802, 1804 of FIG. 18 are generally symmetrical about a magnetic field of zero Oersteds.

Referring now to FIG. 19, a graph 1900 has a horizontal axis with a scale in units of magnetic field in Oersteds and a vertical axis with a scale in units of resistance in ohms.

Two curves 1902, 1904 identified as “forward” and “reverse,” respectively, are representative of transfer curves of magnetic fields in a longitudinal direction relative to the dual spin valve magnetoresistance element 1700 of FIG. 17. The two curves 1902, 1904 have peak and a notch.

It can be seen that the forward and reverse longitudinal transfer curves 1902, 1904 of FIG. 19 are generally symmetrical about a magnetic field of zero Oersteds.

Since the transverse and longitudinal transfer curves of FIGS. 18 and 19 are generally symmetrical about the magnetic field of zero Oersteds, then, in the presence of a rotating magnetic field, a resulting resistance characteristic and a resulting voltage characteristic of an electronic circuit can have a more symmetrical sinusoid shape and a duty cycle closer to fifty percent than for the magnetoresistance elements 400, 1000.

Also, as described above, by incorporating dual spin valves with the partial pinning generated by particular Ru layers 1708, 1710 described above, the noise of steps of the transfer function of FIG. 1 can be reduced or eliminated.

Referring now to FIG. 20, a dual spin valve magnetoresistance element 2000 includes a portion 2002 like a portion (not including seed layer 402 or cap layer 418) of the reversed double pinned magnetoresistance element 1200 of FIG. 12 and also a portion 2004 like a portion (not including seed layer 402 or cap layer 418) of the double pinned magnetoresistance element 1100 of FIG. 11. A common antiferromagnetic pinning layer 2006 can be in the middle.

The dual spin valve magnetoresistance element 2000 can have two free layer structures, for which spacer layers 2008, 2010 can have different thicknesses selected to result in different couplings to the free layer structures so that the two free layer structures have magnetic fields with opposite directions as shown. The directions of the magnetic fields in the two free layer structures can be reversed from the direction shown.

In some embodiments, the spacer layer 2010 can have a thickness that can be in one of two example ranges, e.g., about 1.0 nm to about 1.7 nm or about 2.3 nm to about 3.0 nm, to result in a ferromagnetic coupling between the spacer layer 2010 and the adjacent lower free layer structure.

In some embodiments, the spacer layer 2008 has a thickness that can be in one of two example ranges, e.g., about 1.7 nm to about 2.3 nm or about 3.0 nm to about 3.7 nm, to result in an antiferromagnetic coupling between the spacer layer 2009 and the adjacent upper free layer structure.

Thus, it will be appreciated that the two free layer structures have nominal directions in opposing directions. This is like a combination the transfer curves of FIGS. 13 and 14 and FIGS. 15 and 16, but associated with two separate magnetoresistance elements (1000 and 1100).

In addition, by selection of thickness of the two spacer layers 2008, 2010, the two couplings, antiferromagnetic and ferromagnetic, can have about the same magnitude, but in opposite directions.

It should be further appreciated that operation of the dual spin valve magnetoresistance element 2000 operates very much like a series stack combination of the magnetoresistance elements 1100 of FIG. 11 and 1200 of FIG. 12, but where two resulting spacer layers 2002, 2004 (412 of FIGS. 11 and 12) have selected thickness to result in a ferromagnetic coupling to the lower free layer structure and an antiferromagnetic coupling to the upper free layer structure.

In some alternate embodiments, the spacer layer 2010 can have the thickness of the spacer layer 2008 and vice versa.

The dual spin valve magnetoresistance element 2000 has four synthetic antiferromagnetic (SAF) pinned structures. Thus, there are two double pinned structures in the dual spin valve magnetoresistance element 2000.

The four synthetic antiferromagnetic (SAF) pinned are referred to herein as pinned layer structures.

Transfer curves 18, 19 are indicative of operation of the dual spin valve magnetoresistance element 2000. Advantages of the dual spin valve magnetoresistance element 2000 of FIG. 20 are described above in conjunction with FIG. 17. Further advantages are obtained with the dual spin valve magnetoresistance element 2000. Namely, by using additional SAFs, various stability improvements described above in conjunction with FIG. 11 are also obtained in the dual spin valve magnetoresistance element 2000.

Still further advantages are derived by using two free layer structures in the magnetoresistance elements 1700 and 2000 of FIGS. 17 and 20, respectively. Namely, a higher magnetoresistance ratio is achieved, i.e., a higher sensitivity to magnetic fields.

From the arrangements of FIGS. 17 and 20, it should be appreciated that there can be any even number of free layer structures, any even number of pinned layers, and any even number of the selectable thickness spacer layers, e.g., 1708, 1710, 2008, 2010 to achieve the improved duty cycles described above. Thus, arrangements described herein are not limited to dual spin value arrangements. Arrangements can include quad spin valves and greater numbers of spin valves in a stacked arrangement to achieve a magnetoresistance element.

While particular layer thicknesses are shown in FIGS. 4, 10, 11, 12, 17, and 20 it will be understood that the thicknesses of some layers can be different.

While particular sequences of layers are shown in FIGS. 4, 10, 11, 12, 17, and 20, it should be appreciated that there can be other interposing layers, for example, other spacer layers, between any two or more of the layers shown. Also, there can be other layers above or below the layers shown in FIGS. 4, 10, 11, 12, 17, and 20.

The term “over,” when describing layers that are over each other, is used to indicate a sequence of layers, but not to indicate that layers are necessarily in direct contact. Layers that are over each other can include layers that interpose with each other.

Annealings in accordance with Tables 1, 2, and 3 and steps according to FIGS. 7, 8, and 9 also apply to the dual spin valve magnetoresistance elements 1700 and 2000 of FIGS. 17 and 20, respectively, and also to greater numbers of spin valves in a stacked arrangement. For all of these arrangements, two annealing steps provide magnetic fields in pinned layers structures and surrounding pinning layers in each part of the dual spin valve arrangements (or greater number of stacked spin valves) that are oriented ninety degrees relative to each other.

Referring now to FIG. 21, a prior art dual spin valve 2100 has fewer of the advantages described above for the dual spin valve magnetoresistance elements 1700 or 2000. Notably, the prior art dual spin valve 2100 does not have a common central antiferromagnetic pinning layer (e.g. 1706, 2006 of FIGS. 17 and 20), and does not have the spacers layers (e.g., 1708, 1710, 2008, 2010) that provide different couplings (ferromagnetic and antiferromagnetic) to respective free layer structures.

The following patent applications are incorporated herein by reference in their entirety: U.S. patent application Ser. No. 14/452,783, filed Aug. 6, 2014, U.S. patent application Ser. No. 14/529,564, filed Oct. 31, 2014, and U.S. patent application Ser. No. 14/591,213, filed Jan. 7, 2015.

All references cited herein are hereby incorporated herein by reference in their entirety. Having described preferred embodiments, which serve to illustrate various concepts, structures and techniques, which are the subject of this patent, it will now become apparent that other embodiments incorporating these concepts, structures and techniques may be used. Accordingly, it is submitted that that scope of the patent should not be limited to the described embodiments but rather should be limited only by the spirit and scope of the following claims. 

What is claimed is:
 1. A magnetoresistance element deposited upon a substrate, comprising: an even number of free layer structures, the even number of free layer structures comprising first and second free layer structures; an even number of spacer layers, the even number of spacer layers comprising first and second spacer layers; and an even number of pinned layers structures, the even number of pinned layer structures comprising first and second pinned layer structures, wherein the even number of free layer structures, the even number of spacer layers, and the even number of pinned layer structures are disposed in a stack of layers, wherein a first spacer layers is comprised of a first material with a first thickness, the first material and the first thickness selected to result in a first selected one of an antiferromagnetic coupling or a ferromagnetic coupling between the first pinned layer structures and the first free layer structure, and wherein the second spacer layer is comprised of a second material with a second thickness, the second material and the second thickness selected result in a second selected one of an antiferromagnetic coupling or a ferromagnetic coupling between the second pinned layer structures and the second free layer structures.
 2. The magnetoresistance element of claim 1, wherein the first and second spacer layers are comprised of Ru.
 3. The magnetoresistance element of claim 2, wherein the first selected thickness is in the range of about 1.0 nm to about 1.7 nm or about 2.3 nm to about 3.0 nm, and wherein the second selected thickness is in the range of about 1.7 nm to about 2.3 nm or about 3.0 nm to about 3.7 nm.
 4. The magnetoresistance element of claim 2, wherein the second selected thickness is in the range of about 1.0 nm to about 1.7 nm or about 2.3 nm to about 3.0 nm, and wherein the first selected thickness is in the range of about 1.7 nm to about 2.3 nm or about 3.0 nm to about 3.7 nm.
 5. The magnetoresistance element of claim 2, wherein the first and second pinned layer structures each consist of one respective pinned layer.
 6. The magnetoresistance element of claim 2, wherein the first and second pinned layer structures each comprise a respective synthetic antiferromagnetic (SAF) structure.
 7. The magnetoresistance element of claim 1, wherein the first and second pinned layer structures each consist of one respective pinned layer.
 8. The magnetoresistance element of claim 1, wherein the first and second pinned layer structures each comprise a respective synthetic antiferromagnetic (SAF) structure.
 9. The magnetoresistance element of claim 1, further comprising: an odd number of pinning layers comprising at least first, second, and third pinning layers, the first and second pinning layers magnetically coupled to the first and second pinned layer structures, respectively; wherein the even number of pinned layer structures further comprise third and fourth pinned layer structures, wherein the third pinning layers is a common pinning layer magnetically coupled to both of the third and fourth pinned layer structures.
 10. The magnetoresistance element of claim 9, wherein the first and second pinning layers are comprised of PtMn.
 11. The magnetoresistance element of claim 10, wherein the third pinning layer is comprised of PtMn.
 12. The magnetoresistance element of claim 11, wherein annealed magnetic directions of the first and second pinning layers are parallel to each other, and wherein an annealed magnetic direction of the third pinning layer is ninety degrees relative to the annealed magnetic directions of the first and second pinning layers.
 13. The magnetoresistance element of claim 9, wherein at least a portion of the magnetoresistance element has a yoke shape.
 14. The magnetoresistance element of claim 13, wherein a length (L) of the yoke shape and a length (d) of the lateral arms of the yoke shape are each at least three times a width (w) of the yoke shape, and the width (w) of the yoke shape is between about one μm and about twenty μm, wherein the length (L) is a longest dimension of the yoke shape.
 15. A method of fabricating a magnetoresistance element, comprising: depositing the magnetoresistance element upon a substrate, the magnetoresistance element comprising: an even number of free layer structures, the even number of free layer structures comprising first and second free layer structures; an even number of spacer layers, the even number of spacer layers comprising first and second spacer layers; and an even number of pinned layers structures, the even number of pinned layer structures comprising first and second pinned layer structures, wherein the even number of free layer structures, the even number of spacer layers, and the even number of pinned layer structures are disposed in a stack of layers, wherein a first spacer layers is comprised of a first material with a first thickness, the first material and the first thickness selected to result in a first selected one of an antiferromagnetic coupling or a ferromagnetic coupling between the first pinned layer structures and the first free layer structure, and wherein the second spacer layer is comprised of a second material with a second thickness, the second material and the second thickness selected result in a second selected one of an antiferromagnetic coupling or a ferromagnetic coupling between the second pinned layer structures and the second free layer structures, wherein the method further comprises: annealing the magnetoresistance element.
 16. The method of claim 15, wherein the first and second spacer layers are comprised of Ru.
 17. The method of claim 16, wherein the first selected thickness is in the range of about 1.0 nm to about 1.7 nm or about 2.3 nm to about 3.0 nm, and wherein the second selected thickness is in the range of about 1.7 nm to about 2.3 nm or about 3.0 nm to about 3.7 nm.
 18. The method of claim 16, wherein the second selected thickness is in the range of about 1.0 nm to about 1.7 nm or about 2.3 nm to about 3.0 nm, and wherein the first selected thickness is in the range of about 1.7 nm to about 2.3 nm or about 3.0 nm to about 3.7 nm.
 19. The method of claim 16, wherein the first and second pinned layer structures each consist of one respective pinned layer.
 20. The method of claim 16, wherein the first and second pinned layer structures each comprise a respective synthetic antiferromagnetic (SAF) structure.
 21. The method of claim 15, wherein the first and second pinned layer structures each consist of one respective pinned layer.
 22. The method of claim 15, wherein the first and second pinned layer structures each comprise a respective synthetic antiferromagnetic (SAF) structure.
 23. The method of claim 15, wherein the deposited magnetoresistance element further comprises: an odd number of pinning layers comprising at least first, second, and third pinning layers, the first and second pinning layers magnetically coupled to the first and second pinned layer structures, respectively; wherein the even number of pinned layer structures further comprise third and fourth pinned layer structures, wherein the third pinning layers is a common pinning layer magnetically coupled to both of the third and fourth pinned layer structures.
 24. The method of claim 23, wherein the first and second pinning layers are comprised of PtMn.
 25. The method of claim 24, wherein the third pinning layer is comprised of PtMn.
 26. The method of claim 25, wherein the annealing comprises: annealing magnetic directions of the first and second pinning layers parallel to each other; and annealing a magnetic direction of the third pinning layer to be ninety degrees relative to the annealed magnetic directions of the first and second pinning layers.
 27. The method of claim 23, further comprising: patterning the magnetoresistance element to have yoke shape.
 28. The method of claim 27, wherein a length (L) of the yoke shape and a length (d) of the lateral arms of the yoke shape are each at least three times a width (w) of the yoke shape, and the width (w) of the yoke shape is between about one μm and about twenty μm, wherein the length (L) is a longest dimension of the yoke shape.
 29. A magnetoresistance element, comprising: a substrate; a first pinned layer structure disposed over the substrate; a first spacer layer disposed over the first pinned layer structure; a first free layer structure disposed over the first spacer layer an antiferromagnetic layer disposed over the first free layer structure a second free layer disposed over the antiferromagnetic layer; a second spacer layer disposed over the second free layer structure; and a second pinned layer structure disposed over the second spacer layer; wherein the first spacer layer is comprised of a first selected material with a first selected thickness to result in a first selected one of an antiferromagnetic coupling or a ferromagnetic coupling between the first pinned layer and the first free layer, and wherein the second spacer layer is comprised of the first selected material with a second different selected thickness to result in a second different one of the antiferromagnetic coupling of the ferromagnetic coupling between the second pinned layer and the second free layer.
 30. The magnetoresistance element of claim 29, wherein the first and second spacer layers are comprised of Ru.
 31. The magnetoresistance element of claim 30, wherein the first selected thickness is in the range of about 1.0 nm to about 1.7 nm or about 2.3 nm to about 3.0 nm, and wherein the second selected thickness is in the range of about 1.7 nm to about 2.3 nm or about 3.0 nm to about 3.7 nm.
 32. The magnetoresistance element of claim 30, wherein the second selected thickness is in the range of about 1.0 nm to about 1.7 nm or about 2.3 nm to about 3.0 nm, and wherein the first selected thickness is in the range of about 1.7 nm to about 2.3 nm or about 3.0 nm to about 3.7 nm.
 33. The magnetoresistance element of claim 30, wherein the first and second pinned layer structures each consist of one respective pinned layer.
 34. The magnetoresistance element of claim 30, wherein the first and second pinned layer structures each comprise a respective synthetic antiferromagnetic (SAF) structure.
 35. The magnetoresistance element of claim 29, wherein the first and second pinned layer structures each consist of one respective pinned layer.
 36. The magnetoresistance element of claim 29, wherein the first and second pinned layer structures each comprise a respective synthetic antiferromagnetic (SAF) structure. 